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Use of XPS to Quantify Thickness of Coatings on Nanoparticles

XPS and other surface sensitive methods are being increasingly used to extract quantitative information about organic and inorganic coatings and contamination on nanoparticles. The extraction of coating thickness requires information about particle diameter from other measurements, such as electron...

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Bibliografiske detaljer
Udgivet i:Micros Today
Main Authors: Baer, Donald R., Wang, Yung-Cheng, Castner, David G.
Format: Artigo
Sprog:Inglês
Udgivet: 2016
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5001563/
https://ncbi.nlm.nih.gov/pubmed/27574498
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1551929516000109
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