Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype

NIST is in the process of developing a new scanning electron microscope (SEM) magnification calibration reference standard useful at both high and low accelerating voltages. This standard will be useful for all applications to which the SEM is currently being used, but it has been specifically tailo...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:J Res Natl Inst Stand Technol
Prif Awduron: Postek, Michael T., Vladar, Andras E., Jones, Samuel N., Keery, William J.
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1993
Pynciau:
Article
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC4907700/
https://ncbi.nlm.nih.gov/pubmed/28053483
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.098.033
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