High-density mapping of quantitative trait loci for grain-weight and spikelet number in rice

BACKGROUND: High grain yield is one of the most important traits requiring improvement in rice breeding programs. Consequently, the genetic basis of spikelets per panicle (SPP) and grain weight (TGW) have received much research focus because of their importance in rice yield. RESULTS: In this study,...

Descrizione completa

Salvato in:
Dettagli Bibliografici
Pubblicato in:Rice (N Y)
Autori principali: Kim, Dong-Min, Lee, Hyun-Sook, Kwon, Soo-Jin, Fabreag, Mark Edward, Kang, Ju-Won, Yun, Yeo-Tae, Chung, Chong-Tae, Ahn, Sang-Nag
Natura: Artigo
Lingua:Inglês
Pubblicazione: Springer New York 2014
Soggetti:
Research
Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC4884038/
https://ncbi.nlm.nih.gov/pubmed/26055996
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s12284-014-0014-5
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne! !

Documenti analoghi