High-density mapping of quantitative trait loci for grain-weight and spikelet number in rice

BACKGROUND: High grain yield is one of the most important traits requiring improvement in rice breeding programs. Consequently, the genetic basis of spikelets per panicle (SPP) and grain weight (TGW) have received much research focus because of their importance in rice yield. RESULTS: In this study,...

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Vydáno v:Rice (N Y)
Hlavní autoři: Kim, Dong-Min, Lee, Hyun-Sook, Kwon, Soo-Jin, Fabreag, Mark Edward, Kang, Ju-Won, Yun, Yeo-Tae, Chung, Chong-Tae, Ahn, Sang-Nag
Médium: Artigo
Jazyk:Inglês
Vydáno: Springer New York 2014
Témata:
Research
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4884038/
https://ncbi.nlm.nih.gov/pubmed/26055996
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s12284-014-0014-5
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