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High-density mapping of quantitative trait loci for grain-weight and spikelet number in rice
BACKGROUND: High grain yield is one of the most important traits requiring improvement in rice breeding programs. Consequently, the genetic basis of spikelets per panicle (SPP) and grain weight (TGW) have received much research focus because of their importance in rice yield. RESULTS: In this study,...
Tallennettuna:
| Julkaisussa: | Rice (N Y) |
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| Päätekijät: | , , , , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Springer New York
2014
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4884038/ https://ncbi.nlm.nih.gov/pubmed/26055996 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s12284-014-0014-5 |
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