High-density mapping of quantitative trait loci for grain-weight and spikelet number in rice

BACKGROUND: High grain yield is one of the most important traits requiring improvement in rice breeding programs. Consequently, the genetic basis of spikelets per panicle (SPP) and grain weight (TGW) have received much research focus because of their importance in rice yield. RESULTS: In this study,...

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Bibliographische Detailangaben
Veröffentlicht in:Rice (N Y)
Hauptverfasser: Kim, Dong-Min, Lee, Hyun-Sook, Kwon, Soo-Jin, Fabreag, Mark Edward, Kang, Ju-Won, Yun, Yeo-Tae, Chung, Chong-Tae, Ahn, Sang-Nag
Format: Artigo
Sprache:Inglês
Veröffentlicht: Springer New York 2014
Schlagworte:
Research
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4884038/
https://ncbi.nlm.nih.gov/pubmed/26055996
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s12284-014-0014-5
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