טוען...
High-density mapping of quantitative trait loci for grain-weight and spikelet number in rice
BACKGROUND: High grain yield is one of the most important traits requiring improvement in rice breeding programs. Consequently, the genetic basis of spikelets per panicle (SPP) and grain weight (TGW) have received much research focus because of their importance in rice yield. RESULTS: In this study,...
שמור ב:
| הוצא לאור ב: | Rice (N Y) |
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| Main Authors: | , , , , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Springer New York
2014
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4884038/ https://ncbi.nlm.nih.gov/pubmed/26055996 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s12284-014-0014-5 |
| תגים: |
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