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Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation
To the extent that tips are not perfectly sharp, images produced by scanned probe microscopies (SPM) such as atomic force microscopy and scanning tunneling microscopy are only approximations of the specimen surface. Tip-induced distortions are significant whenever the specimen contains features with...
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| Udgivet i: | J Res Natl Inst Stand Technol |
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| Hovedforfatter: | |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1997
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4882144/ https://ncbi.nlm.nih.gov/pubmed/27805154 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.102.030 |
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