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Probing Access Resistance of Solid-state Nanopores with a Scanning Probe Microscope Tip

An apparatus that integrates solid-state nanopore ionic current measurement with a Scanning Probe Microscope has been developed. When a micrometer-scale scanning probe tip is near a voltage biased nanometer-scale pore (10–100 nm), the tip partially blocks the flow of ions to the pore and increases t...

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Detalhes bibliográficos
Main Authors: Hyun, Changbae, Rollings, Ryan, Li, Jiali
Formato: Artigo
Idioma:Inglês
Publicado em: 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3268918/
https://ncbi.nlm.nih.gov/pubmed/22393313
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/smll.201101337
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