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Probing Access Resistance of Solid-state Nanopores with a Scanning Probe Microscope Tip
An apparatus that integrates solid-state nanopore ionic current measurement with a Scanning Probe Microscope has been developed. When a micrometer-scale scanning probe tip is near a voltage biased nanometer-scale pore (10–100 nm), the tip partially blocks the flow of ions to the pore and increases t...
Gorde:
| Egile Nagusiak: | , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
2011
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3268918/ https://ncbi.nlm.nih.gov/pubmed/22393313 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/smll.201101337 |
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