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Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation
To the extent that tips are not perfectly sharp, images produced by scanned probe microscopies (SPM) such as atomic force microscopy and scanning tunneling microscopy are only approximations of the specimen surface. Tip-induced distortions are significant whenever the specimen contains features with...
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| 發表在: | J Res Natl Inst Stand Technol |
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| 主要作者: | |
| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1997
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| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4882144/ https://ncbi.nlm.nih.gov/pubmed/27805154 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.102.030 |
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