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De novo phasing with optimized XFEL data
Nass et al. [IUCrJ (2016), 3, 180–191] have demonstrated that serial femtosecond crystallography (SFX) data collected at X-ray free-electron lasers (XFELs) can be successfully phased using only the weak anomalous scattering from the native S atoms.
Tallennettuna:
| Julkaisussa: | IUCrJ |
|---|---|
| Päätekijä: | |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
International Union of Crystallography
2016
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4856137/ https://ncbi.nlm.nih.gov/pubmed/27158501 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516006758 |
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