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XFEL diffraction: developing processing methods to optimize data quality
Serial crystallography, using either femtosecond X-ray pulses from free-electron laser sources or short synchrotron-radiation exposures, has the potential to reveal metalloprotein structural details while minimizing damage processes. However, deriving a self-consistent set of Bragg intensities from...
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| Pubblicato in: | J Synchrotron Radiat |
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| Autore principale: | |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
International Union of Crystallography
2015
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4344359/ https://ncbi.nlm.nih.gov/pubmed/25723925 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514028203 |
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