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Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO(2)) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the perfor...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | J Synchrotron Radiat |
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| Κύριοι συγγραφείς: | , , , , , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
International Union of Crystallography
2015
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4787028/ https://ncbi.nlm.nih.gov/pubmed/26134800 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515009686 |
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