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Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution

Continued improvement of the energy resolution of resonant inelastic x-ray scattering (RIXS) spectrometers is crucial for fulfilling the potential of this technique in the study of electron dynamics in materials of fundamental and technological importance. In particular, RIXS is the only alternative...

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Enregistré dans:
Détails bibliographiques
Publié dans:Sci Rep
Auteurs principaux: Kim, Jungho, Casa, D., Said, Ayman, Krakora, Rich, Kim, B. J., Kasman, Elina, Huang, Xianrong, Gog, T.
Format: Artigo
Langue:Inglês
Publié: Nature Publishing Group UK 2018
Sujets:
Accès en ligne:https://ncbi.nlm.nih.gov/pmc/articles/PMC5792644/
https://ncbi.nlm.nih.gov/pubmed/29386577
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-20396-z
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