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Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution

Continued improvement of the energy resolution of resonant inelastic x-ray scattering (RIXS) spectrometers is crucial for fulfilling the potential of this technique in the study of electron dynamics in materials of fundamental and technological importance. In particular, RIXS is the only alternative...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Sci Rep
Prif Awduron: Kim, Jungho, Casa, D., Said, Ayman, Krakora, Rich, Kim, B. J., Kasman, Elina, Huang, Xianrong, Gog, T.
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: Nature Publishing Group UK 2018
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC5792644/
https://ncbi.nlm.nih.gov/pubmed/29386577
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-20396-z
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