Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO(2)) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the perfor...

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Bibliografiske detaljer
Udgivet i:J Synchrotron Radiat
Main Authors: Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, Yavaş, Hasan
Format: Artigo
Sprog:Inglês
Udgivet: International Union of Crystallography 2015
Fag:
Research Papers
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4787028/
https://ncbi.nlm.nih.gov/pubmed/26134800
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515009686
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