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Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene
Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscop...
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| Publicado en: | Sci Rep |
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| Main Authors: | , , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4754635/ https://ncbi.nlm.nih.gov/pubmed/26878907 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep21045 |
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