X-ray Reciprocal Space Mapping of Graded Al(x)Ga(1 − x)N Films and Nanowires

The depth distribution of strain and composition in graded Al(x)Ga(1 − x)N films and nanowires (NWs) are studied theoretically using the kinematical theory of X-ray diffraction. By calculating [Formula: see text] reciprocal space maps (RSMs), we demonstrate significant differences in the intensity d...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Nanoscale Res Lett
Egile Nagusiak: Stanchu, Hryhorii V., Kuchuk, Andrian V., Kladko, Vasyl P., Ware, Morgan E., Mazur, Yuriy I., Zytkiewicz, Zbigniew R., Belyaev, Alexander E., Salamo, Gregory J.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Springer US 2016
Gaiak:
Nano Express
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC4747973/
https://ncbi.nlm.nih.gov/pubmed/26860714
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-016-1299-7
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