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Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast
We have investigated how accurately atomic-resolution annular dark-field (ADF) images match between experiments and simulations to conduct more reliable crystal structure analyses. Quantitative ADF imaging, in which the ADF intensity at each pixel represents the fraction of the incident probe curren...
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| Publicado en: | Microscopy (Oxf) |
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| Autores principales: | , , , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Oxford University Press
2015
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4711290/ https://ncbi.nlm.nih.gov/pubmed/26347577 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfv053 |
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