Llwytho...

Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast

We have investigated how accurately atomic-resolution annular dark-field (ADF) images match between experiments and simulations to conduct more reliable crystal structure analyses. Quantitative ADF imaging, in which the ADF intensity at each pixel represents the fraction of the incident probe curren...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Microscopy (Oxf)
Prif Awduron: Yamashita, Shunsuke, Koshiya, Shogo, Nagai, Takuro, Kikkawa, Jun, Ishizuka, Kazuo, Kimoto, Koji
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: Oxford University Press 2015
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC4711290/
https://ncbi.nlm.nih.gov/pubmed/26347577
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfv053
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