Direct Observation of the Biaxial Stress Effect on Efficiency Droop in GaN-based Light-emitting Diode under Electrical Injection

Light-emitting diode (LED) efficiency has attracted considerable interest because of the extended use of solid-state lighting. Owing to lack of direct measurement, identification of the reasons for efficiency droop has been restricted. A direct measurement technique is developed in this work for cha...

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Detaylı Bibliyografya
Yayımlandı:Sci Rep
Asıl Yazarlar: Zheng, Jinjian, Li, Shuiqing, Chou, Chilun, Lin, Wei, Xun, Feilin, Guo, Fei, Zheng, Tongchang, Li, Shuping, Kang, Junyong
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Nature Publishing Group 2015
Konular:
Article
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC4669452/
https://ncbi.nlm.nih.gov/pubmed/26634816
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep17227
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