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Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

Precise measurement and characterization of electrostatic potential structures and the concomitant electric fields at nanodimensions are essential to understand and control the properties of modern materials and devices. However, directly observing and measuring such local electric field information...

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Detalles Bibliográficos
Publicado en:Sci Rep
Autores principales: Shibata, Naoya, Findlay, Scott D., Sasaki, Hirokazu, Matsumoto, Takao, Sawada, Hidetaka, Kohno, Yuji, Otomo, Shinya, Minato, Ryuichiro, Ikuhara, Yuichi
Formato: Artigo
Lenguaje:Inglês
Publicado: Nature Publishing Group 2015
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Acceso en línea:https://ncbi.nlm.nih.gov/pmc/articles/PMC4464396/
https://ncbi.nlm.nih.gov/pubmed/26067359
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10040
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