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Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

Precise measurement and characterization of electrostatic potential structures and the concomitant electric fields at nanodimensions are essential to understand and control the properties of modern materials and devices. However, directly observing and measuring such local electric field information...

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Dades bibliogràfiques
Publicat a:Sci Rep
Autors principals: Shibata, Naoya, Findlay, Scott D., Sasaki, Hirokazu, Matsumoto, Takao, Sawada, Hidetaka, Kohno, Yuji, Otomo, Shinya, Minato, Ryuichiro, Ikuhara, Yuichi
Format: Artigo
Idioma:Inglês
Publicat: Nature Publishing Group 2015
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC4464396/
https://ncbi.nlm.nih.gov/pubmed/26067359
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10040
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