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Direct electric field imaging of graphene defects
Material properties are sensitive to atomistic structure defects such as vacancies or impurities, and it is therefore important to determine not only the local atomic configuration but also their chemical bonding state. Annular dark-field scanning transmission electron microscopy (STEM) combined wit...
Tallennettuna:
| Julkaisussa: | Nat Commun |
|---|---|
| Päätekijät: | , , , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Nature Publishing Group UK
2018
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6155138/ https://ncbi.nlm.nih.gov/pubmed/30250209 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-018-06387-8 |
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