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Direct electric field imaging of graphene defects
Material properties are sensitive to atomistic structure defects such as vacancies or impurities, and it is therefore important to determine not only the local atomic configuration but also their chemical bonding state. Annular dark-field scanning transmission electron microscopy (STEM) combined wit...
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| Publicado no: | Nat Commun |
|---|---|
| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6155138/ https://ncbi.nlm.nih.gov/pubmed/30250209 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-018-06387-8 |
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