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Electric field imaging of single atoms
In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors. Recently, it has been shown that the atomic-scale electric field of both the positive atomic nuclei and the surrounding ne...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | Nat Commun |
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| Κύριοι συγγραφείς: | , , , , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Nature Publishing Group
2017
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5459997/ https://ncbi.nlm.nih.gov/pubmed/28555629 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms15631 |
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