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Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy
Precise measurement and characterization of electrostatic potential structures and the concomitant electric fields at nanodimensions are essential to understand and control the properties of modern materials and devices. However, directly observing and measuring such local electric field information...
Gespeichert in:
| Veröffentlicht in: | Sci Rep |
|---|---|
| Hauptverfasser: | , , , , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Nature Publishing Group
2015
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4464396/ https://ncbi.nlm.nih.gov/pubmed/26067359 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10040 |
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