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Dissipation signals due to lateral tip oscillations in FM-AFM
We study the coupling of lateral and normal tip oscillations and its effect on the imaging process of frequency-modulated dynamic atomic force microscopy. The coupling is induced by the interaction between tip and surface. Energy is transferred from the normal to the lateral excitation, which can be...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4273252/ https://ncbi.nlm.nih.gov/pubmed/25551032 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.5.213 |
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