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Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus
Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This method enables the simultaneous recording of several material properties and, at the same time, it also increases the sensitivity of the microscope. Here w...
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| Main Authors: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2012
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3323908/ https://ncbi.nlm.nih.gov/pubmed/22496992 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.22 |
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