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Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This method enables the simultaneous recording of several material properties and, at the same time, it also increases the sensitivity of the microscope. Here w...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Herruzo, Elena T, Garcia, Ricardo
Format: Artigo
Sprache:Inglês
Veröffentlicht: Beilstein-Institut 2012
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3323908/
https://ncbi.nlm.nih.gov/pubmed/22496992
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.22
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