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Optimization of phase contrast in bimodal amplitude modulation AFM
Bimodal force microscopy has expanded the capabilities of atomic force microscopy (AFM) by providing high spatial resolution images, compositional contrast and quantitative mapping of material properties without compromising the data acquisition speed. In the first bimodal AFM configuration, an ampl...
Gorde:
| Argitaratua izan da: | Beilstein J Nanotechnol |
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| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Beilstein-Institut
2015
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4463493/ https://ncbi.nlm.nih.gov/pubmed/26114079 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.108 |
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