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Optimization of phase contrast in bimodal amplitude modulation AFM

Bimodal force microscopy has expanded the capabilities of atomic force microscopy (AFM) by providing high spatial resolution images, compositional contrast and quantitative mapping of material properties without compromising the data acquisition speed. In the first bimodal AFM configuration, an ampl...

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Bibliographic Details
Published in:Beilstein J Nanotechnol
Main Authors: Damircheli, Mehrnoosh, Payam, Amir F, Garcia, Ricardo
Format: Artigo
Language:Inglês
Published: Beilstein-Institut 2015
Subjects:
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC4463493/
https://ncbi.nlm.nih.gov/pubmed/26114079
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.108
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