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Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus
Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This method enables the simultaneous recording of several material properties and, at the same time, it also increases the sensitivity of the microscope. Here w...
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| 主要な著者: | , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Beilstein-Institut
2012
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3323908/ https://ncbi.nlm.nih.gov/pubmed/22496992 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.22 |
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