Loading...
Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
We present a design of a nanometrology measuring setup which is a part of the national standard instrumentation for nanometrology operated by the Czech Metrology Institute (CMI) in Brno, Czech Republic. The system employs a full six-axis interferometric position measurement of the sample holder cons...
Na minha lista:
| Main Authors: | , , , , , , , , |
|---|---|
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Molecular Diversity Preservation International (MDPI)
2014
|
| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3926591/ https://ncbi.nlm.nih.gov/pubmed/24451463 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s140100877 |
| Tags: |
Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
|