Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy

Por Lazar, Josef, Klapetek, Petr, Valtr, Miroslav, Hrabina, Jan, Buchta, Zdenek, Cip, Onrej, Cizek, Martin, Oulehla, Jindrich, Sery, Mojmir
Publicado em 2014