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Defect Inspection of Flip Chip Solder Bumps Using an Ultrasonic Transducer

Surface mount technology has spurred a rapid decrease in the size of electronic packages, where solder bump inspection of surface mount packages is crucial in the electronics manufacturing industry. In this study we demonstrate the feasibility of using a 230 MHz ultrasonic transducer for nondestruct...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Su, Lei, Shi, Tielin, Xu, Zhensong, Lu, Xiangning, Liao, Guanglan
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Molecular Diversity Preservation International (MDPI) 2013
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC3892821/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s131216281
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