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Measurements of G-values for DNA Damage Induced by Low Energy Electrons
We address the problem of measurement of G-values (damage per deposited energy) for low energy electrons (LEEs) below 30 eV. Such values (G(LEE)) usually have to be derived from damage yields in nanometer (~10nm) thick films, which are too thin to allow complete absorption of the energy of LEEs. In...
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| 主要な著者: | , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2011
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3846539/ https://ncbi.nlm.nih.gov/pubmed/22035128 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/jp207922n |
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