Ładuje się......
Scanning X-ray nanodiffraction: from the experimental approach towards spatially resolved scattering simulations
An enhancement on the method of X-ray diffraction simulations for applications using nanofocused hard X-ray beams is presented. We combine finite element method, kinematical scattering calculations, and a spot profile of the X-ray beam to simulate the diffraction of definite parts of semiconductor n...
Zapisane w:
| Główni autorzy: | , , , , , , |
|---|---|
| Format: | Artigo |
| Język: | Inglês |
| Wydane: |
Springer
2012
|
| Hasła przedmiotowe: | |
| Dostęp online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3583809/ https://ncbi.nlm.nih.gov/pubmed/23039065 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-553 |
| Etykiety: |
Dodaj etykietę
Nie ma etykietki, Dołącz pierwszą etykiete!
|