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Thin film deposition of metal oxides in resistance switching devices: electrode material dependence of resistance switching in manganite films

The electric-pulse-induced resistance switching in layered structures composed of polycrystalline Pr(1−x)Ca(x)MnO(3) (PCMO) sandwiched between Pt bottom electrode and top electrodes of various metals (metal/PCMO/Pt) was studied by direct current current–voltage (I-V) measurements and alternating cur...

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Autori principali: Nakamura, Toshihiro, Homma, Kohei, Tachibana, Kunihide
Natura: Artigo
Lingua:Inglês
Pubblicazione: Springer 2013
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC3577670/
https://ncbi.nlm.nih.gov/pubmed/23414549
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-76
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