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The use of artificial neural networks in electrostatic force microscopy
The use of electrostatic force microscopy (EFM) to characterize and manipulate surfaces at the nanoscale usually faces the problem of dealing with systems where several parameters are not known. Artificial neural networks (ANNs) have demonstrated to be a very useful tool to tackle this type of probl...
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| Main Authors: | , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer
2012
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3461489/ https://ncbi.nlm.nih.gov/pubmed/22587580 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-250 |
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