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Electrostatic interaction in atomic force microscopy
In atomic force microscopy, the stylus experiences an electrostatic force when imaging in aqueous medium above a charged surface. This force has been calculated numerically with continuum theory for a silicon nitrite or silicon oxide stylus. For comparison, the Van der Waals force was also calculate...
में बचाया:
| मुख्य लेखक: | |
|---|---|
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
1991
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC1260129/ https://ncbi.nlm.nih.gov/pubmed/19431803 |
| टैग : |
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