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Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films

The effect of surface roughness on the Seebeck coefficient in the sub-50-nm scale silicon ultra thin films is investigated theoretically using nonequilibrium Green's function formalism. For systematic studies, the surface roughness is modelled by varying thickness periodically with square wave...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Kumar, Manoj, Bagga, Anjana, Neeleshwar, S
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Springer 2012
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC3395578/
https://ncbi.nlm.nih.gov/pubmed/22390685
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-169
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