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Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods prop...

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Detaylı Bibliyografya
Asıl Yazarlar: Welker, Joachim, Illek, Esther, Giessibl, Franz J
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Beilstein-Institut 2012
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC3323913/
https://ncbi.nlm.nih.gov/pubmed/22496997
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.27
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