Welker, J., Illek, E., & Giessibl, F. J. (2012). Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein-Institut.
Citação norma ChicagoWelker, Joachim, Esther Illek, and Franz J. Giessibl. Analysis of Force-deconvolution Methods in Frequency-modulation Atomic Force Microscopy. Beilstein-Institut, 2012.
Citação norma MLAWelker, Joachim, Esther Illek, and Franz J. Giessibl. Analysis of Force-deconvolution Methods in Frequency-modulation Atomic Force Microscopy. Beilstein-Institut, 2012.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.