Citace podle APA

Welker, J., Illek, E., & Giessibl, F. J. (2012). Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein-Institut.

Styl Chicago

Welker, Joachim, Esther Illek, a Franz J. Giessibl. Analysis of Force-deconvolution Methods in Frequency-modulation Atomic Force Microscopy. Beilstein-Institut, 2012.

Citace podle MLA

Welker, Joachim, Esther Illek, a Franz J. Giessibl. Analysis of Force-deconvolution Methods in Frequency-modulation Atomic Force Microscopy. Beilstein-Institut, 2012.

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