Carregant...
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods prop...
Guardat en:
| Autors principals: | , , |
|---|---|
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2012
|
| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3323913/ https://ncbi.nlm.nih.gov/pubmed/22496997 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.27 |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|