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Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)

Noncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact potential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives only a qualitative impression. We introd...

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Bibliographic Details
Main Authors: Held, Christian, Seyller, Thomas, Bennewitz, Roland
Format: Artigo
Language:Inglês
Published: Beilstein-Institut 2012
Subjects:
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC3304321/
https://ncbi.nlm.nih.gov/pubmed/22428109
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.19
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