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Scaling properties of ballistic nano-transistors

Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated I(D )- V(D)-traces separating the regimes of classically allowed transport and tunneling transport. In this conference contribution,...

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Detalhes bibliográficos
Main Authors: Wulf, Ulrich, Krahlisch, Marcus, Richter, Hans
Formato: Artigo
Idioma:Inglês
Publicado em: Springer 2011
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3211455/
https://ncbi.nlm.nih.gov/pubmed/21711899
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-365
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