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Reference-free particle selection enhanced with semi-supervised machine learning for cryo-electron microscopy

Reference-based methods have dominated the approaches to the particle selection problem, proving fast and accurate on even the most challenging micrographs. A reference volume, however, is not always available and building a set of reference projections from the data itself requires significant effo...

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Détails bibliographiques
Auteurs principaux: Langlois, Robert, Pallesen, Jesper, Frank, Joachim
Format: Artigo
Langue:Inglês
Publié: 2011
Sujets:
Accès en ligne:https://ncbi.nlm.nih.gov/pmc/articles/PMC3205936/
https://ncbi.nlm.nih.gov/pubmed/21708269
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2011.06.004
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