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Reference-free particle selection enhanced with semi-supervised machine learning for cryo-electron microscopy
Reference-based methods have dominated the approaches to the particle selection problem, proving fast and accurate on even the most challenging micrographs. A reference volume, however, is not always available and building a set of reference projections from the data itself requires significant effo...
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| Auteurs principaux: | , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
2011
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3205936/ https://ncbi.nlm.nih.gov/pubmed/21708269 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2011.06.004 |
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