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Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing
[Image: see text] A unique method for quantitative in situ nanotensile testing in a transmission electron microscope employing focused ion beam fabricated specimens was developed. Experiments were performed on copper samples with minimum dimensions in the 100–200 nm regime oriented for either single...
Αποθηκεύτηκε σε:
| Κύριοι συγγραφείς: | , |
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| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
American Chemical Society
2011
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| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3172822/ https://ncbi.nlm.nih.gov/pubmed/21793497 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/nl201890s |
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