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Dislocation driven nanosample plasticity: new insights from quantitative in-situ TEM tensile testing

Intrinsic dislocation mechanisms in the vicinity of free surfaces of an almost FIB damage-free single crystal Ni sample have been quantitatively investigated owing to a novel sample preparation method combining twin-jet electro-polishing, in-situ TEM heating and FIB. The results reveal that the smal...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Veröffentlicht in:Sci Rep
Hauptverfasser: Samaee, Vahid, Gatti, Riccardo, Devincre, Benoit, Pardoen, Thomas, Schryvers, Dominique, Idrissi, Hosni
Format: Artigo
Sprache:Inglês
Veröffentlicht: Nature Publishing Group UK 2018
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6089927/
https://ncbi.nlm.nih.gov/pubmed/30104742
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-30639-8
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