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Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing

[Image: see text] A unique method for quantitative in situ nanotensile testing in a transmission electron microscope employing focused ion beam fabricated specimens was developed. Experiments were performed on copper samples with minimum dimensions in the 100–200 nm regime oriented for either single...

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Detalhes bibliográficos
Main Authors: Kiener, D., Minor, A. M.
Formato: Artigo
Idioma:Inglês
Publicado em: American Chemical Society 2011
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3172822/
https://ncbi.nlm.nih.gov/pubmed/21793497
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/nl201890s
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