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Strength, Hardening, and Failure Observed by In Situ TEM Tensile Testing**

We present in situ transmission electron microscope tensile tests on focused ion beam fabricated single and multiple slip oriented Cu tensile samples with thicknesses in the range of 100–200 nm. Both crystal orientations fail by localized shear. While failure occurs after a few percent plastic strai...

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Detalhes bibliográficos
Main Authors: Kiener, Daniel, Kaufmann, Petra, Minor, Andrew M.
Formato: Artigo
Idioma:Inglês
Publicado em: WILEY-VCH Verlag 2012
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3573867/
https://ncbi.nlm.nih.gov/pubmed/23447712
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/adem.201200031
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