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Easy and direct method for calibrating atomic force microscopy lateral force measurements
We have designed and tested a new, inexpensive, easy-to-make and easy-to-use calibration standard for atomic force microscopy (AFM) lateral force measurements. This new standard simply consists of a small glass fiber of known dimensions and Young’s modulus, which is fixed at one end to a substrate a...
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| Main Authors: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2007
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3018784/ https://ncbi.nlm.nih.gov/pubmed/17614616 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.2745733 |
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