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High-Temperature Stable Operation of Nanoribbon Field-Effect Transistors

We experimentally demonstrated that nanoribbon field-effect transistors can be used for stable high-temperature applications. The on-current level of the nanoribbon FETs decreases at elevated temperatures due to the degradation of the electron mobility. We propose two methods of compensating for the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Choi, Chang-Young, Lee, Ji-Hoon, Koh, Jung-Hyuk, Ha, Jae-Geun, Koo, Sang-Mo, Kim, Sangsig
Format: Artigo
Sprache:Inglês
Veröffentlicht: Springer 2010
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC2964476/
https://ncbi.nlm.nih.gov/pubmed/21124629
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11671-010-9714-y
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